University desires to purchase one to three semiconductor parameter analyzers (quantity as determined by University). These will be used as part of the Knight Campus Graduate Internship Program in semiconductor devices. This program has placed hundreds of master’s students in the semiconductor industry over the past 20 years. The semiconductor parameter analyzers must meet the following required specifications (those items marked “preferred” are not required in order to submit a proposal, but are preferred by University): 1.1 Integrated system for the current-voltage and capacitance voltage characterization of semiconductor devices. This includes two-terminal C-V and I-V measurements on semiconductor junctions (including as photovoltaics), three terminal measurements on transistors, and four wire measurements (Kelvin resistance measurement). University strongly prefers all measurement hardware in a single mainframe. 1.2 Two source measure units with output up to +/- 210 V / 100 mA and with 0.2 microvolt / 100fA resolution or better, 4 quadrant operation, and 2 or 4-wire connections. 1.3 Capacitance unit capable of AC impedance measurements over wide frequency range (preferred: 1kHZ – 10 MHz) with DC bias (specify range of DC bias) and up to 100 mV or larger AC drive. Able to display impedance data in different representations including absolute magnitude of impedance and phase angle. 1.4 Functions accessible and results displayed on front panel of instrument. 1.5 Software for computer interfacing the full functionality of the parameter analyzer. 1.6 (Strongly Preferred. Quote as option if available and not included.) Automated switching matrix to switch between IV and CV measurements.
