ORNL is in need of laser profilers that provide high resolution measurement at a rate up to 1 meter per minute of sub millimeter scale. The ORNL research focuses on the investigation and analysis of sub-millimeter topological variations in active and conductive particles under compression, and how these variations influence the long-term performance. Slurry is applied to a conductive substrate that is opaque, limiting the types of sensor modalities available for topology variation data acquisition. This data is a crucial component of a digital platform for advanced battery manufacturing, with the ultimate goal of scaling production to industry standards, where manufacturing rates of 1 meter per minute are expected.
