Please note: This is a Sole Source Notification. Specifications include, but are not limited to: We require a compact X-ray Laue system to be used primarily for measuring orientation in single crystal samples for identification and crystal cutting applications. The system must permit transfer of oriented crystals for subsequent cutting and polishing in a manner that is compatible with our existing equipment. It is necessary therefore that the system uses a removable, nonmotorized, x-ray-track-mounted 3-axis goniometer. The goniometer should possess a wide adjustment range (25 degrees or greater) in each degree of freedom to facilitate crystal orientation while minimizing the need for remounting. A horizontal beam configuration is required as is usual for crystal cutting Laue systems. The system must allow for the x-ray spot size diameter at the sample location to be adjusted from less than 0.25mm up to 1mm or greater to accommodate the different sample sizes to be used. The system must be stand-alone and not require consumables (e.g. gas supply to detector) or external connections (e.g., external water cooling) other than 120V 60Hz single phase power to be supplied from a standard wall outlet. The system must include an x-ray enclosure with safety interlock whose maximum dimension does not exceed 36” in order to fit into the available space. A non-motorized 3-axis linear translation stage must be included for sample positioning within the enclosure. The procured system should include control software for the Laue system and suitable analysis software for the data. The included software must be capable of sub-pixel indexing, Laue pattern fitting and modeling, and calculating angular adjustments required to achieve a desired orientation. Due to the large variety of crystal systems of interest, the software must include an interface to a database allowing import of crystal data including lattice parameters and space group for known crystal systems.
