Bid Item: Benchtop scanning electron microscope (quantity 1) Bid Item Minimum Specifications: Acceleration Voltages: 5 kV to 15 kV (or higher). Multiple beam currents. Wide magnification range from about 200 to 150,000x (or higher). Resolution: preferably below 10 nm. Long-lasting electron source. Large chamber with x-y motorized stage. Sample holders. Accommodate 4 cm×4 cm samples. Short sample loading time. High and (optionally) low vacuum modes of operation. Integrated navigation video camera. Detectors: Secondary electron detector. Backscatter electron detector. Energy dispersive X-ray spectroscopy detector for elemental mapping. Software platform for instrument control, data acquisition, and data analysis, including EDS analysis. Element identification during live acquisition. Elemental mapping and line scan. Data acquisition computer. Preferred specifications: Intel CoreTM i7/i9 Processor or AMD equivalent, 4.0 GB SDRAM Video dedicated card, Dual Monitor Capability, 1 TB SSD hard drive, minimum memory: 32 GB DDR4 3200 Mhz, 16X DVD+/-RW, will read/write CD’s, USB 3.0 Ports, 6 on back, 2 on front, HDMI port, Display port, two (2) Ethernet Ports required, with current Microsoft Windows. Computer monitor.
